At the end of the 3rd loop of the Microtech Booster (, the idea presented by IRIS was selected. The ultimate ambition of the project is to produce a system for the simultaneous detection of X-rays and short-wavelength infrared (SWIR), mainly for improving the inspection of composite aircraft structures or controlling the quality in metal-on-metal additive manufacturing by electron beams. The feasibility study aims to demonstrate that it is possible to overcome the technical contradiction between the need for a high temperature to carry out the annealing of a thin layer of semiconductor and that of preserving the electronics of the detector from undesirable effects of heat diffusion.